Search results for author:"Wen-Wei Laio"
Total records matched: 1 Search took: 0.066 secs
An Empirical Evaluation of the Slip Correction in the Four Parameter Logistic Models with Computerized Adaptive Testing
Applied Psychological Measurement Vol. 36, No. 2 (March 2012) pp. 75–87
In a selected response test, aberrant responses such as careless errors and lucky guesses might cause error in ability estimation because these responses do not actually reflect the knowledge that examinees possess. In a computerized adaptive test ...